Automated test system for testing singulated electronic components and a method of testing singulated electronic components

US12203976B2 · kind B2 · utility

Assignee

• Cohu GmbH · DE

Inventors

• Anton Schuster · Grassau, DE
• Andreas Wiesböck · Stephanskirchen, DE
• Stefan Binder · Rosenheim, DE

Key dates

• Filing date: May 14, 2020
• Grant date: Jan 21, 2025
• Expiry date: May 14, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2893
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An automated test system for testing singulated electronic components comprises a handler, comprising a plurality of handler pickers and/or spinner pickers, the handler pickers and/or spinner pickers being adapted to each pickup one electronic component, at least one processing station for processing one of the electronic components, a first carrier, a second carrier, and a test unit, for testing singulated electronic components located on a carrier. When the second plurality of electronic components on the second carrier are tested in the test unit while the second plurality of electronic components rest on the second carrier, simultaneously the first carrier is loaded with the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers and/or unloaded from the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers.