Method and device for detecting display panel defect
US12205269B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 11, 2021 |
| Grant date | Jan 21, 2025 |
| Priority date | — |
| Expiry date | Apr 22, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for detecting a display panel defect, including: collecting a panel image of a to-be-detected display panel, a plurality of first pixels of the display panel corresponding to a plurality of second pixels in the panel image; converting the panel image into a binary image; dilating each bright spot region in the binary image such that adjacent bright spot regions communicate with each other to form at least one closed communication region in the binary image; determining a region of interest mask image in the binary image in accordance with the at least one closed communication region; determining a region of interest in accordance with the region of interest mask image and the panel image; and performing feature identification on the region of interest to determine a defect of the display panel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.