Defect detection system
US12205360B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 15, 2022 |
| Grant date | Jan 21, 2025 |
| Priority date | — |
| Expiry date | Dec 20, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computing system generates a training data set for training the prediction model to detect defects present in a target surface of a target specimen and training the prediction model to detect defects present in the target surface of the target specimen based on the training data set. The computing system generates the training data set by identifying a set of images for training the prediction model, the set of images comprising a first subset of images. A deep learning network generates a second subset of images for subsequent labelling based on the set of images comprising the first subset of images. The deep learning network generates a third subset of images for labelling based on the set of images comprising the first subset of images and the labeled second subset of images. The computing system continues the process until a threshold number of labeled images is generated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.