Method and system for high-speed dual-view band-limited illumination profilometry
US12206832B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 2021 |
| Grant date | Jan 21, 2025 |
| Priority date | — |
| Expiry date | Aug 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10152
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system and a method for high-speed dual-view band-limited illumination profilometry using temporally interlaced acquisition is disclosed. The method comprises using a projecting unit for projecting sinusoidal fringe patterns onto an object and capturing fringe patterns deformed by the object. A 3D image of the object is recovered pixel by pixel from partial images provided by a first camera and a second camera by locating a point in the images of the second camera that matches a selected pixel of the first camera. 3D coordinates and wrapped phase are then estimated based on a calibration of the cameras and determining an horizontal coordinate on the plane of a projector of the projecting unit based on a calibration of the projector, and using a wrapped phase value to recover a 3D point of 3D coordinates (x, y, z).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.