Patent · US Active

Implementing specific hardware to follow an efficient measurement protocol

US12209857B2 · kind B2 · utility

0Cited by
22References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 25, 2022
Grant dateJan 28, 2025
Priority date
Expiry dateJul 21, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/37443
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method measures an object having a feature. The feature has a plurality of profiles each having a surface. The method provides a coordinate measuring machine (CMM) having a wrist coupled with a measuring prob. The probe has a tolerance angle with respect to a surface normal of a surface to be measured. The wrist has a first given orientation that is adjustable to a second given orientation. The method determines an ideal vector that can be used to measure a given segment within the tolerance. The method also determines the wrist orientation in a CMM coordinate space. The method determines the ideal vector in the CMM coordinate space to define a part vector. A probe vector is determined from the wrist and probe characteristics. The probe vector is aligned with the part vector. The feature is measured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.