Patent · US Active

Frequency shifter for heterodyne interferometry measurements and device for heterodyne interferometry measurements having such a frequency shifter

US12209861B2 · kind B2 · utility

0Cited by
1References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 11, 2020
Grant dateJan 28, 2025
Priority date
Expiry dateMar 23, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/4206
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

The invention refers to a frequency shifter for heterodyne interferometry measurements, comprising a chip, an input waveguide configured to guide a light beam, at least four phase modulators, each being arranged to receive the light beam from the input waveguide and configured to modulate a phase of the light beam, an output combiner being arranged to let the light beams modulated by each phase modulator interfere, a first output waveguide coupled to the output combiner and configured to receive the modulated light beams constructively interfering at the output combiner, a second output waveguide coupled to the output combiner and configured to receive the modulated light beams destructively interfering at the output combiner, wherein the input waveguide, the phase modulators, the output combiner, the first output waveguide and the second output waveguide are arranged on the chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.