Fiber-optic based material property measurement system and related methods
US12209961B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2023 |
| Grant date | Jan 28, 2025 |
| Priority date | — |
| Expiry date | Mar 23, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.