Single-particle localization microscope
US12210145B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 16, 2023 |
| Grant date | Jan 28, 2025 |
| Priority date | — |
| Expiry date | Sep 6, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A single-particle localization microscope, including an optical system configured to illuminate a sample region with a sequence of light patterns having spatially different distributions of illumination light adapted to cause a single particle located in the sample region to emit detection light, a detector configured to detect a sequence of intensities of the detection light emerging from the sample region in response to the sequence of illuminating light patterns, and a processor configured to determine, based on the sequence of intensities of the detection light, an arrangement of potential positions for locating the particle. The processor further illuminates the sample region with at least one subsequent light pattern, causes detection of at least one subsequent intensity, and decides, based on the at least one subsequent intensity of the detection light, which one of the multiple potential positions represents an actual position of the particle in the sample region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.