Semiconductor devices having a defect detector and data storage systems including the same
US12211758B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Dec 22, 2021 |
| Grant date | Jan 28, 2025 |
| Priority date | — |
| Expiry date | May 18, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2225/06596
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor device and data storage system, the device including a substrate having a first region, a second region surrounding the first region, and a third region surrounding the second region; a memory structure on the first region; a first defect detector on the second region; and a dam structure on the third region, wherein the dam structure surrounds the first defect detector and includes a plurality of conductive lines stacked on the third region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.