Method and control arrangement for monitoring coating quality of secondary cells
US12211986B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 2, 2024 |
| Grant date | Jan 28, 2025 |
| Priority date | — |
| Expiry date | May 2, 2044 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E60/10
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method and control arrangement for monitoring coating quality during production of electrodes of secondary cells. The production of electrodes comprises a coating process including coating slurry onto a conductive substrate and drying the coated conductive substrate, and a calendering process. The method comprises measuring (S1), during the coating process and/or calendering process, power consumption of one or more electrical components used for performing the coating process and/or calendering process and evaluating (S3) the coating quality by analyzing the measured power consumption using coating quality criteria, wherein the coating quality criteria defines coating quality of the secondary cells based on measured power consumption of the one or more electrical components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.