Method for calibrating a THz measuring apparatus, THz measuring method and corresponding THz measuring apparatus
US12216050B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 9, 2020 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | Jul 21, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/952
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for calibrating a THz measuring apparatus (8), in particular a pipe, on a measurement object (10), comprising at least the following steps: providing a THz measuring apparatus (8) having a plurality of pivotable THz sensors (1), arranged in a circumferential direction around a measuring chamber (9), for outputting one THz transmitted beam (12) each along a sensor axis (B) (provision step); orienting the THz sensors (1) into a starting position in the measuring chamber (9) in which the measurement object (10) is received (orientation step in starting position); allocating the THz sensors (1) to at least one first and one second sensor group (group formation step); first calibration adjustment step, in which the second sensor group is adjusted as an adjustment group by means of the first sensor group as a starting group, and corresponding second calibration adjustment step, in which the first sensor group is adjusted as an adjustment group by means of the previously calibration-adjusted second sensor group as a starting group; wherein, in each of the calibration adjustment steps=by means of the THz sensors (S1, S3, S5, S7) of the starting group, spac…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.