Device for wavefront analysis and microscopic imaging systems comprising such analysis devices
US12216056B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2024 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | Mar 15, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one aspect, the present description relates to a device for analysing a wavefront, configured to be connected to a fluorescence microscopy imaging system with optical sectioning, equipped with a microscope objective comprising a pupil in a pupil plane, the analysis device comprising a two-dimensional detector comprising a detection plane; a two-dimensional arrangement of microlenses, arranged in an analysis plane, each microlens being configured to form, on the detection plane, when the analysis device is connected to the microscopic imaging system, an image of an object situated in a focal plane of the microscope objective, with a given analysis field; an optical relay system configured to optically conjugate the analysis plane and the pupil plane; a field diaphragm positioned in a plane optically conjugated with the plane of detection, and configured to define said analysis field; a processing unit configured to determine, based on the set of images formed by the microlenses, a two-dimensional map of a characteristic parameter of the wavefront in said analysis plane.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.