Electronic device having a testing method for determining defects in a sensor layer
US12216144B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2023 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | Jun 23, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2839
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a method for testing an electronic device, the method includes: providing an electronic device including a display layer and a sensor layer on the display layer and configured to operate at a touch drive frequency, the sensor layer including a plurality of first electrodes and a plurality of second electrodes insulatively intersecting the plurality of first electrodes; providing a test signal having a test frequency higher than the touch drive frequency to the plurality of first electrodes; measuring mutual capacitance with the plurality of first electrodes through the plurality of second electrodes; and determining whether or not the sensor layer is defective, based on the mutual capacitance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.