Generalized expectation maximization for semi-supervised learning
US12217136B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 22, 2020 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | Jan 26, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Techniques are described that extend supervised machine-learning algorithms for use with semi-supervised training. Random labels are assigned to unlabeled training data, and the data is split into k partitions. During a label-training iteration, each of these k partitions is combined with the labeled training data, and the combination is used train a single instance of the machine-learning model. Each of these trained models are then used to predict labels for data points in the k−1 partitions of previously-unlabeled training data that were not used to train of the model. Thus, every data point in the previously-unlabeled training data obtains k−1 predicted labels. For each data point, these labels are aggregated to obtain a composite label prediction for the data point. After the labels are determined via one or more label-training iterations, a machine-learning model is trained on data with the resulting composite label predictions and on the labeled data set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.