Systems and methods for processing x-ray images
US12217430B2 · kind B2 · utility
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4References
20Claims
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Key dates
| Filing date | Nov 24, 2021 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | Mar 28, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure is related to systems and methods for processing X-ray images. A method for processing an X-ray image may include obtaining an X-ray image; and determining a metal image based on the X-ray image by using a trained metal detection model. The metal image includes information of a metal object in the X-ray image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.