Learning device, image processing device, parameter generation device, learning method, and image processing method
US12217486B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2019 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | Nov 23, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a learning device, a first learning unit performs first machine learning using first training data including a first evaluation result for an evaluation target image to generate a first learned model outputting a second evaluation result for an input image, an evaluation unit uses the first learned model to acquire a plurality of the second evaluation results for a plurality of the input images, a generation unit selects a second image quality parameter from a plurality of first image quality parameters having different values, based on the plurality of the second evaluation results and generates second training data including the selected second image quality parameter, and a second learning unit performs second machine learning using the second training data to generate a second learned model outputting a third image quality parameter used for processing a processing target image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.