Defect inspection system having human-machine interaction function
US12217498B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 15, 2022 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | Aug 11, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A defect inspection system is disclosed, and comprises a linear light source, N number of cameras, a display device, a tag reader, and a modular electronic device, in which the linear light source, the cameras and the modular electronic device are used for conducting a defect inspection of an article. On the other hand, the display device, the tag reader and the modular electronic device are adopted for conducting in production of at least one labeled example. Therefore, the modular electronic device is allowed to apply a machine learning process to an image classifier under using a training dataset containing the labeled examples, thereby producing at least one new defect recognition model or updating the existing defect recognition model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.