Patent · US Active

Plasma etching method using perfluoropropyl carbinol

US12217970B2 · kind B2 · utility

0Cited by
3References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 2, 2021
Grant dateFeb 4, 2025
Priority date
Expiry dateDec 21, 2041

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P70/50
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Disclosed is a plasma etching method. The plasma etching method comprises: a first step for evaporating liquid perfluoropropyl carbinol (PPC); a second step for supplying a discharge gas including the evaporated PPC and argon gas to a plasma chamber in which an object to be etched is arranged; and a third step for discharging the discharge gas to generate plasma, and using the plasma to plasma-etch the object to be etched.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.