Automated sample weight measurement via optical inspection
US12219117B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 11, 2023 |
| Grant date | Feb 4, 2025 |
| Priority date | — |
| Expiry date | May 11, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/57
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method includes the steps collecting measurement data of a sample utilizing an adaptable inspection unit or while the sample is in-flight, determining a volume or area of the sample based at least in part on the measurement data, and calculating a weight of the sample based at least in part on the volume or area of the sample. The measurement data includes a captured image that includes a plurality of pixels. The determining of the volume of the sample includes determining the number of pixels in the captured image that display a portion of the sample, or determining the maximum number of consecutive pixels that display a portion of the sample in two or three dimensions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.