Near-field test method, system, readable storage medium and computer
US12222382B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2022 |
| Grant date | Feb 11, 2025 |
| Priority date | — |
| Expiry date | Sep 30, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/0871
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A near-field testing method proposed in the present invention includes steps of: in a selected coordinate system, controlling a mover to cause random relative movement of the DUT and the probe to generate multiple random test points, determining one or more postures of the probe, and obtaining the electromagnetic field coefficients of the probe corresponding the postures of the probe respectively; obtaining measured values of the electromagnetic field signals collected by the probes, and obtaining a set of measured values; according to the set of measured values, the electromagnetic field coefficients of the probe, and according to the Lorenz reciprocity theorem in electromagnetism, determining electromagnetic field coefficients of the DUT through convex optimization; obtaining, according to the electromagnetic field coefficients of the DUT, a far field pattern of the DUT or an electric field and/or a magnetic field at any point outside the DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.