Method for grain size analysis
US12229933B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 1, 2021 |
| Grant date | Feb 18, 2025 |
| Priority date | — |
| Expiry date | Mar 18, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30128
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods for analysis of the magnetic grain using a software program effectively and accurately by improving the magnetic grain boundary contrast from an image prior to analyzing the grain size with an imaging analysis program. A method for automated grain size analysis includes obtaining a SEM electronic image of a magnetic material composed of a plurality of grains and modifying the image by smoothing the image, removing high spatial and low spatial frequencies from the image, improving contrast of the image, pixelating the image, processing the image to a binary image, and clearing outer edges of the binary image to remove at least incomplete grains to generate grain size data from the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.