Manufacturing method of a component carrier, handling system, computer program and system architecture
US12229941B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2022 |
| Grant date | Feb 18, 2025 |
| Priority date | — |
| Expiry date | May 18, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for manufacturing a component carrier. The method includes (a) supplying a semifinished or finished component carrier to an automatic or semi-automatic optical inspection device and (b) performing an automatic or semi-automatic optical inspection by capturing a first image with a first illumination; capturing a second image with a second illumination; comparing a data set indicative of the first image and/or the second image with a reference data set; and identifying potential defects; (c) performing a quality classification of the semifinished or finished component carrier by generating a virtual third image indicative of the component carrier under a virtual different third illumination having a third spectral composition different from both the first spectral composition and from the second spectral composition; processing the three images; classifying the potential defects in true defects and false defects; and (d) taking action based on the quality classification. Further described is a system architecture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.