Patent · US Active

Methods and measurement systems for precisely evaluating a device under test

US12230890B2 · kind B2 · utility

0Cited by

5References

4Claims

0Family size

Assignee

Fraunhofer-Gesellschaft zur förderung der angewandten Forschung e.V. · DE

Inventors

Paul Simon Holt LEATHER · Cahors, FR
Ramez ASKAR · Berlin, DE
Kei Sakaguchi · Berlin, DE
Thomas Haustein · Potsdam, DE
Leszek RASCHKOWSKI · Berlin, DE

Key dates

Filing date	Sep 23, 2022
Grant date	Feb 18, 2025
Priority date	—
Expiry date	Sep 23, 2042

Classification

Technology area (CPC H)Electricity
CPC primaryH04B17/29
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

A method includes defining a Center-of-Radiation Reference for a device under test, the CORR indicating a reference origin of an electromagnetic wave pattern formable with the DUT; determining a 3-dimensional orientation information with respect to the CORR, the 3-dimensional orientation information indicating a direction of the electromagnetic wave pattern; and providing the CORR and the 3-dimensional orientation information to a measurement system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.