Method and system for high-resolution multi-parametric quantitative magnetic resonance imaging
US12232860B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 31, 2023 |
| Grant date | Feb 25, 2025 |
| Priority date | — |
| Expiry date | Aug 10, 2043 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02A90/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for fast high-resolution multi-parametric quantitative magnetic resonance imaging comprises: designing a fast high-resolution multiple overlapping-echo imaging pulse sequence; determining sampling parameters of the pulse sequence; constructing a deep neural network for reconstructing high-resolution multi-parametric quantitative magnetic resonance images; generating training samples of the deep neural network; using the training samples to train the deep neural network to obtain trained deep neural networks; scanning a real imaging object using the pulse sequence under the sampling parameters to obtain k-space data of the real imaging object; pre-processing the k-space data of the real imaging object to obtain image domain data of the real imaging object; and inputting the image domain data of the real imaging object into the trained deep neural networks for the reconstructing to obtain the high-resolution multi-parametric quantitative magnetic resonance images of the real imaging object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.