Methods for determining and calibrating non-linearity in a Phase Interpolator and related devices and systems
US12235318B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 7, 2023 |
| Grant date | Feb 25, 2025 |
| Priority date | — |
| Expiry date | Jul 7, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3171
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems for determining and calibrating non-linearity in a phase interpolator. Embodiments determine a first jitter value that causes the bit error rate (BER) of a data sequence to exceed a predefined target BER, when a recovered clock is aligned with the data sequence at a first PI code. The recovered clock is obtained from a data pattern representing the data sequence. Embodiments determine a second jitter value that causes the BER of the data sequence to exceed the predefined target BER at a second PI code. The first PI code may immediately precede or succeed the second PI code. Embodiments determine a Differential Non-Linearity (DNL) corresponding to the second PI code, based on a phase shift introduced to the recovered clock by the second PI code relative to the first PI code, the first jitter value, and the second jitter value. All DNL values corresponding to all PI codes may be determined in a similar manner. An Integral Non-Linearity (INL) may be determined by integrating the DNL corresponding to all PI codes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.