Diagnostic device for the characterization of electromagnetic material properties
US12235335B2 · kind B2 · utility
0Cited by
3References
21Claims
0Family size
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Key dates
| Filing date | Nov 17, 2022 |
| Grant date | Feb 25, 2025 |
| Priority date | — |
| Expiry date | Oct 5, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/032
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to diagnostic device for the characterization of electromagnetic material properties and a method of making and using same. Unlike current diagnostic devices, the diagnostic device comprises a novel waveguide system and is suitable for the characterization of electromagnetic material properties such as permittivity, permeability, and the loss tangent of materials over a broad temperature and pressure range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.