Patent · US Active

Methods for calibrating a processing machine, and processing machines

US12235619B2 · kind B2 · utility

0Cited by
11References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 9, 2020
Grant dateFeb 25, 2025
Priority date
Expiry dateSep 10, 2043

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P10/25
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

The disclosure provides methods for calibrating processing machines for the production of 3D components by irradiation of powder layers, wherein the processing machine includes a scanner device for positioning a laser beam in a processing field in which a height-adjustable construction platform for the application of the powder layers by sweeping at least two, e.g., three markings, e.g., in the form of spherical retroreflectors, which are applied on the construction platform and/or on a preform, by the laser beam, detecting laser radiation reflected back from the markings into the scanner device, determining actual positions of the markings, determining deviations of the actual positions of the markings from setpoint positions of the markings, and calibrating the processing machine by correcting the positioning of the laser beam and/or the position of the construction platform using the determined deviations. The disclosure also relates to associated processing machines.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.