Methods of generating circuit models and manufacturing integrated circuits using the same
US12236178B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2021 |
| Grant date | Feb 25, 2025 |
| Priority date | — |
| Expiry date | Aug 7, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of generating a circuit model used to simulate an integrated circuit may include generating first feature element data and second feature element data by classifying feature data of a target semiconductor device according to measurement conditions, generating first target data and second target data by preprocessing the first feature element data and the second feature element data, respectively, generating a first machine learning model using the first target data and extracting a second machine learning model using the second target data, and generating the circuit model used to simulate the integrated circuit using the first machine learning model and the second machine learning model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.