Detection of bad detectors at idle state
US12242005B2 · kind B2 · utility
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Key dates
| Filing date | Dec 13, 2020 |
| Grant date | Mar 4, 2025 |
| Priority date | — |
| Expiry date | Dec 13, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/2018
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A fault checker system for an X-ray detector, comprising an input interface (IN) for receiving readings acquired by a target detector pixel not exposed to X-radiation. A converter (CV) is configured to convert the readings into a metric. A thresholder (CP) is configured to compare the metric against at least one threshold and, based on the comparing, provide an indication on whether the detector pixel is faulty.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.