STED microscopy method with improved signal to noise ratio in low photon count imaging conditions
US12243194B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 8, 2020 |
| Grant date | Mar 4, 2025 |
| Priority date | — |
| Expiry date | Sep 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20064
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method for generating a result image. The method comprises the steps of: acquiring a STED image of a sample, the STED image comprising pixels; calculating Fourier coefficients of arrival times for the pixels of the image, resulting in real coefficients representing a first image and in imaginary coefficients representing a second image; deriving an intensity image from the STED image; applying a spatial filter to the first image, the second image and the intensity image, resulting in a filtered first image, a filtered second image, and filtered intensity image, respectively; calculating an image G based on the filtered first image and the filtered intensity image; calculating an image S based on the filtered second image and the filtered intensity image; and calculating a result image based on the image G and the image S.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.