Patent · US Active

Systems and methods for equipment inspection

US12243220B2 · kind B2 · utility

0Cited by
0References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 10, 2021
Grant dateMar 4, 2025
Priority date
Expiry dateMay 18, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30164
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method includes receiving image data representative of an appearance of an equipment part prior to an inspection process and evaluating the image data with a machine learning model that defines baseline image data to determine whether the image data indicates the equipment part has been prepared for the inspection. The inspection process may be prevented when the evaluation indicates that the equipment part has not been prepared. A system includes a controller that receives image data representative of an appearance of an equipment part obtained prior to an inspection process. The controller uses a machine learning model to evaluate the image data with respect to baseline image data to determine whether the equipment part has been prepared for the inspection process. The controller prevents the performance of the inspection process based on the evaluation indicating that the equipment part has not been prepared for the inspection process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.