Patent · US Active

Method for configuring an image evaluation device and also image evaluation method and image evaluation device

US12243287B2 · kind B2 · utility

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12Claims
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Assignee

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Key dates

Filing dateSep 16, 2019
Grant dateMar 4, 2025
Priority date
Expiry dateMay 26, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V2201/03
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An image analysis device (BA) is configured to recognize imaged objects. A plurality of training images (TPIC) assigned to an object type (OT) and an object sub-type (OST) are fed into a first neural network module (CNN) to detect image features. Training output data sets (FEA) of the first neural network module are fed into a second neural network module (MLP) to detect object types using the detected image features. For each object type: training images assigned to the object type (OT1, OT2) are fed into the trained first neural network module, the first neural network module training output data set (FEA1, FEA2) generated for the respective training image is assigned to the object sub-type (OST) of the respective training image, and by means of the aforementioned sub-type assignments, a sub-type detection module (BMLP1, BMLP2) is configured to detect object sub-types.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.