Systems and methods for analyzing remote sensing imagery
US12243301B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 3, 2023 |
| Grant date | Mar 4, 2025 |
| Priority date | — |
| Expiry date | Jan 3, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/11
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Disclosed systems and methods relate to remote sensing, deep learning, and object detection. Some embodiments relate to machine learning for object detection, which includes, for example, identifying a class of pixel in a target image and generating a label image based on a parameter set. Other embodiments relate to machine learning for geometry extraction, which includes, for example, determining heights of one or more regions in a target image and determining a geometric object property in a target image. Yet other embodiments relate to machine learning for alignment, which includes, for example, aligning images via direct or indirect estimation of transformation parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.