Voltage output test circuit, voltage divider output circuit, and memory
US12243613B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2022 |
| Grant date | Mar 4, 2025 |
| Priority date | — |
| Expiry date | Jun 23, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of this invention provide a voltage output test circuit, a voltage divider output circuit, and a memory. The voltage output test circuit includes: a first voltage divider unit, including a first terminal and a second terminal, where the first terminal of the first voltage divider unit is connected to a test power supply, and the second terminal of the first voltage divider unit is connected to an output terminal; a second voltage divider unit, including a first terminal and a second terminal, where the first terminal of the second voltage divider unit is connected to a ground, and the second terminal of the second voltage divider unit is electrically connected to the output terminal; and a third voltage divider unit, configured to adjust a resistance between the output terminal and the ground.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.