Patent · US Active

Estimation of life of switching devices

US12248016B2 · kind B2 · utility

0Cited by
2References
21Claims
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Key dates

Filing dateDec 12, 2022
Grant dateMar 11, 2025
Priority date
Expiry dateMay 16, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B23/0283
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A health signature of each switching device in a control system is estimated using system parameters such as a DC-link voltage, three-phase voltages, three-phase currents, and temperature. The switching devices can be implemented as transistors, and a health signature for each transistor may be an on-state resistance or an on-state voltage of the transistors. For example, the on-state resistance for a metal-oxide-semiconductor field-effect transistor (MOSFET) functions as a health signature. Alternatively, the on-state voltage is used as a health signature for an insulated-gate bipolar transistor (IGBT). Additionally, a junction temperature is estimated for each transistor. Using the estimated health signatures and the junction temperatures, the remaining useful life of each transistor is estimated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.