Estimation of life of switching devices
US12248016B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2022 |
| Grant date | Mar 11, 2025 |
| Priority date | — |
| Expiry date | May 16, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0283
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A health signature of each switching device in a control system is estimated using system parameters such as a DC-link voltage, three-phase voltages, three-phase currents, and temperature. The switching devices can be implemented as transistors, and a health signature for each transistor may be an on-state resistance or an on-state voltage of the transistors. For example, the on-state resistance for a metal-oxide-semiconductor field-effect transistor (MOSFET) functions as a health signature. Alternatively, the on-state voltage is used as a health signature for an insulated-gate bipolar transistor (IGBT). Additionally, a junction temperature is estimated for each transistor. Using the estimated health signatures and the junction temperatures, the remaining useful life of each transistor is estimated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.