Impedance measurement system
US12248026B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 21, 2022 |
| Grant date | Mar 11, 2025 |
| Priority date | — |
| Expiry date | May 18, 2043 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E60/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An impedance measurement system configured to measure impedance of a measurement target capable of supplying power to an electrical load device includes one or more processors and one or more memories. The one or more processors are configured to perform a process including: acquiring data about output power from the measurement target when an alternating current signal of at least one frequency is superimposed on the output power; calculating impedance at the at least one frequency with data about an exclusion period when waveform distortion of the output power is detected being excluded; and in a case where how many times the data about the exclusion period is excluded at a certain frequency is greater than or equal to a predetermined threshold value, changing of a setting of an operating condition of an electronic device coupled to the measurement target or the electrical load device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.