Patent · US Active

Signal processing circuit and measurement instrument

US12253554B2 · kind B2 · utility

0Cited by

6References

13Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Wolfgang Wendler · Puchheim, DE
Gregor Feldhaus · Munich, DE
Florian Ramian · Munich, DE

Key dates

Filing date	Mar 3, 2023
Grant date	Mar 18, 2025
Priority date	—
Expiry date	Mar 3, 2043

Classification

Technology area (CPC G)Physics
CPC primaryG01R35/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A signal processing circuit for a measurement instrument is described. The signal processing circuit includes an analysis circuit, a measurement input, and at least two parallel measurement channels. The parallel measurement channels are configured to process the input signal, thereby generating first and second complex-valued measurement signals. The analysis circuit is configured to determine first and second error quantities associated with the first and second complex-valued measurement signals, respectively. The analysis circuit is configured to determine a complex-valued average signal corresponding to a combined average of the first and second complex-valued measurement signals. The analysis circuit is configured to determine a combined error quantity based on the complex-valued average signal. The analysis circuit is configured to determine a comparison quantity based on the combined error quantity as well as based on the first error quantity and/or the second error quantity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.