Instance segmentation method and apparatus
US12254636B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2022 |
| Grant date | Mar 18, 2025 |
| Priority date | — |
| Expiry date | Jul 19, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An instance segmentation method and apparatus are provided. A to-be-trained segmentation network performs the following processing on each instance group that is in a sample original image and that is of pixels of a marked instance, where each instance group includes at least one marked instance, and the processing includes: predicting at least two different first basic feature maps and a first attention feature map corresponding to each first basic feature map; performing weighted processing on the at least two first basic feature maps and pixel values of respective first attention feature maps corresponding to the at least two first basic feature maps, to obtain a first feature fusion map; and training the to-be-trained segmentation network based on the first feature fusion map and the sample original image. A segmentation model can precisely determine pixels of an instance in an original image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.