Patent · US Active

Devices, systems, and methods for calibrating and maintaining a temperature of materials in an additive manufacturing build chamber

US12257626B2 · kind B2 · utility

0Cited by
6References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 15, 2021
Grant dateMar 25, 2025
Priority date
Expiry dateMay 7, 2043

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P10/25
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Devices, systems, and methods for calibrating for an electron beam additive manufacturing system. The electron beam manufacturing system includes electron beam guns. A calibration system includes an optical pyrometer. The optical pyrometer captures thermal radiation emitted from raw material. An analysis component is communicatively coupled to the optical pyrometer. The analysis component is programmed to determine calibration parameters from information from the optical pyrometer and a phase transition temperature.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.