Test fixture for supporting a device under test
US12259302B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 5, 2023 |
| Grant date | Mar 25, 2025 |
| Priority date | — |
| Expiry date | Oct 19, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M7/027
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test fixture configured to support a DUT (device under test) and including a bottom base, two mounting bases, a rotatable base and a supporting base. The two mounting bases stand on a side of the bottom base and are spaced apart from each other. The rotatable base is rotatably disposed on the two mounting bases. At least a part of the rotatable base is located between the two mounting bases. The supporting base is fixed on a side of the rotatable base and configured to support the DUT. When the supporting base is parallel to the bottom base, the supporting base is located on a side of the rotatable base located farthest away from the bottom base.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.