Device and method for measuring microwave surface resistance of dielectric conductor deposition interface

US12265109B2 · kind B2 · utility

Assignee

• University of Electronic Science and Technology of China · CN

Inventors

• Cheng Zeng · Newmarket, CA
• Tianhui Sun · Sichuan, CN
• Junsong Ning · Chengdu, CN
• Shirong Bu · Chengdu, CN
• Zhanping Wang · Sichuan, CN

Key dates

• Filing date: Jan 19, 2023
• Grant date: Apr 1, 2025
• Expiry date: Aug 17, 2043

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R27/04
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A device for measuring a microwave surface resistance of a dielectric conductor deposition interface includes: a test platform, a calibration component, a sealing cavity and a support plate; wherein the test platform comprises: a shielding cavity having an open bottom, a dielectric rod, an input coupling structure, an output coupling structure, and a dielectric supporter; the dielectric conductor test sample and the test platform form a TE0m(n+δ) mode dielectric resonator; the calibration component and the dielectric conductor test sample are mounted on the test platform to measure corresponding quality factors, thereby calculating the microwave surface resistance of the deposition interface of the dielectric conductor test sample. The present invention requires no pre-measurement of relative permittivity and loss tangent of the dielectric conductor test sample. After calibration, the microwave surface resistance of the dielectric conductor deposition interface can be obtained by only one non-destructive measurement.