Computer vision in-store planogram analysis
US12265976B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 6, 2022 |
| Grant date | Apr 1, 2025 |
| Priority date | — |
| Expiry date | Apr 17, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method are disclosed for computer vision in-store planogram analysis. The system includes a retail entity comprising a product display area defined by a planogram, and a planogram analyzer comprising a server which trains a machine learning model to generate recommendations to optimize one or more planogram metrics using historical data and computer vision data. The system generates, by the trained machine learning model, recommendations to optimize the one or more planogram metrics, and alters the planogram based on the one or more recommendations. The system further uses the trained machine learning model with a probabilistic optimization technique approximating a global optimum to generate the one or more recommendations to optimize the one or more planogram metrics. The computer vision includes one or more of eyeball movement, eyeball engagement and eyeball lingering time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.