Image classifier automated testing and outlier detection
US12266209B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2024 |
| Grant date | Apr 1, 2025 |
| Priority date | — |
| Expiry date | Feb 26, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V40/1347
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system to generate an image classifier and test it nearly instantaneously is described herein. Image embeddings generated by an image fingerprinting model are indexed and an associated approximate nearest neighbors (ANN) model is generated. The embeddings in the index are clustered and the clusters are labeled. Users can provide just a few images to add to the index as a labeled cluster. The ANN model is trained to receive an image embedding as input and return a score and label of the most similar identified embedding. The label may be applied if the score exceeds a threshold value. The image classifier can be tested efficiently using Leave One Out Cross Validation (“LOOCV”) to provide near-instantaneous quality indications of the image classifier to the user. Near-instantaneous indications of outliers in the provided images can also be provided to the user using a distance to the centroid calculation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.