Single pulse spectral statistical analysis method for particle size distribution of inclusion on surface of metal material
US12270745B1 · kind B1 · utility
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Inventors
Key dates
| Filing date | Jul 24, 2024 |
| Grant date | Apr 8, 2025 |
| Priority date | — |
| Expiry date | Jul 24, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0061
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A single pulse spectral statistical analysis method for particle size distribution of inclusions on a surface of a metal material is provided. The method includes the following steps: analyzing a surface of an oversized metal material through single pulse discharge continuous excitation scanning to obtain mixed intensity data of spectral intensities of solid solution and inclusions of an inclusion element on the surface of the oversized metal material and a relative frequency distribution diagram; performing peak fitting processing on the relative frequency distribution diagram of the mixed spectral intensities to obtain a relative frequency distribution diagram of the spectral intensities of the inclusion; and correlating particle size information of inclusions of a small sample with distribution data of the spectral intensities of the inclusions to determine a corresponding relation between the particle sizes and the spectral intensities of the inclusions, thereby obtaining a particle size distribution result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.