Systems and methods for monitoring feature sizes in digital X-ray imaging
US12270770B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 28, 2022 |
| Grant date | Apr 8, 2025 |
| Priority date | — |
| Expiry date | Jun 8, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/628
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example portable radiography scanning system includes: a radiation detector configured to generate a digital image based on incident radiation; a radiation emitter configured to output the radiation; a frame configured to hold the radiation emitter and/or the detector such that the emitter directs the radiation to the detector; a first sensor configured to determine a first distance between the detector and emitter; and a computing device configured to: determine a second distance between the emitter and an interface between the radiation and the object; determine a magnification correction factor based on the first and second distances; measure a size, in pixels, of a feature of the object in the image; and: calculate an actual size of the feature based on the magnification correction factor and the measured size, and/or determine whether the measured size of the feature satisfies a threshold size based on the magnification correction factor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.