Sparse representation of measurements
US12270883B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2023 |
| Grant date | Apr 8, 2025 |
| Priority date | — |
| Expiry date | Jun 25, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20081
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A computer system that performs a sparsity technique is described. During operation, the computer system accesses or obtains information associated with non-invasive measurements performed on at least an individual, historical non-invasive measurements, and a dictionary of predetermined features or basis functions associated with the historical non-invasive measurements. Note that the non-invasive measurements and the historical non-invasive measurements may include or correspond to magnetic resonance (MR) measurements. For example, the MR measurements may include magnetic resonance imaging (MRI) scans. Then, the computer system updates the dictionary of predetermined features based at least in part on the non-invasive measurements and the historical non-invasive measurements, where the updating includes performing a minimization technique with a cost function having an L2-norm term and an L0-norm term. Next, the computer system determines weights associated with features in the updated dictionary of predetermined features based at least in part on the non-invasive measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.