Patent · US Active

Dual-mode restoration microscopy

US12272037B2 · kind B2 · utility

0Cited by

1References

14Claims

0Family size

Inventors

Li Yang · Shanghai, CN
Christian Conrad · Berlin, DE
Foo Wei Ten · Berlin, DE
Roland Eils · Berlin, DE

Key dates

Filing date	Feb 17, 2021
Grant date	Apr 8, 2025
Priority date	—
Expiry date	Oct 6, 2041

Classification

Technology area (CPC H)Electricity
CPC primaryH04N5/2628
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A microscope system (100) configured to record images in at least a first and a second imaging mode (501, 502), comprising: An objective (1) collecting light (201) from a sample (11), An illumination module coupled to the objective, A first reimaging objective (5) generating an intermediate image of the sample and a second reimaging objective (6) that relays the intermediate image onto a detection module, An evaluation module (200) comprising a machine learning method (DL), trained with a first and a second set of images of the same sample, wherein the first and second set has been acquired in the first (501) and second imaging mode (502), respectively, wherein upon acquisition of an image (400) in the second imaging mode (502) the trained machine learning method (DL) outputs a restored image (401) that comprises fewer aberrations than the image (400) acquired in the second imaging mode (52, 53, 57).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.