Systems and methods for statistics-based defect pixel detection
US12272041B1 · kind B1 · utility
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Key dates
| Filing date | Jan 31, 2024 |
| Grant date | Apr 8, 2025 |
| Priority date | — |
| Expiry date | Jan 31, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10048
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Described herein are systems and methods for on-the-fly detection of a defective pixel in an image that may include: receiving the image; for each analyzed pixel in the image, selecting an analyzed cell, wherein the analyzed cell includes a plurality of pixels; performing statistical distribution analysis for the plurality of pixels in the analyzed cell; determining an allowed statistical distance for the analyzed pixel relative to the analyzed cell; and determining that the analyzed pixel is a defective pixel if a computed statistical distance of the analyzed pixel exceeds the allowed statistical distance.
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