System and method associated with predicting segmentation quality of objects in analysis of copious image data
US12272059B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 26, 2023 |
| Grant date | Apr 8, 2025 |
| Priority date | — |
| Expiry date | Aug 15, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30181
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of testing an impedance-sensitive system with a switching device, wherein the method comprises: switching the disconnecting device into the on-state configured to permit transmission of energy via the coil; implementing a first measurement with the impedance-sensitive system; switching the disconnecting device into the off-state configured to permit damping of the external positioning signal that couples into the coil so as to reduce the undesirable oscillations of the coil; implementing a second measurement with the impedance-sensitive system; performing a comparison of the first measurement and the second measurement; performing a verification of the comparison with a target specification; and displaying a correct function and/or a malfunction depending on the verification.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.