Patent · US Active

Imprint method and article manufacturing method

US12276908B2 · kind B2 · utility

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5Claims
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Key dates

Filing dateNov 28, 2022
Grant dateApr 15, 2025
Priority date
Expiry dateJul 28, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/0002
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An imprint method of performing an imprint process for a shot region of a substrate using a mold is provided. The substrate includes a valid region where a chip is to be formed, and an invalid region outside the valid region where no chip is to be formed, and the invalid region is a region formed by etching an outer region outside the valid region. The method includes deciding, based on a height difference between the valid region and the invalid region, an imprint condition for a partial shot region defined by an outer edge of the valid region, and performing the imprint process for the partial shot region in accordance with the decided imprint condition.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.